Devices and services catalog
Devices and services catalog
Devices |
Services |
Laboratories
AFM microscope Explorer
Workplace of device "AFM microscope Explorer" | |
---|---|
Workplace: | UPOL - Department of Physical Chemistry |
Faculty: | Faculty of Science - Department of Physical Chemistry |
Street: | 17. listopadu 12 |
City: | Olomouc |
Characteristic of workplace: | Areas of study nanomaterials, molecular files and biomacromolecules. The Department is involved in research in areas with broad potential application of molecular electronics to molecular medicine. |
Device "AFM microscope Explorer" | |
---|---|
Manufacter | ThermoMicroscopes (USA) |
Number of pcs. | 1 |
Year | 2000 |
Conditions | Sample Size: unlimited for flat samples Sample Requirements: rigid or rigidly attached, clean |
Usage | The Atomic Force Microscopy (AFM) is an instrument used for three-dimensional analysis of the sample topography. It allows us to precisely describe surface topography in the micrometer-scale, both laterally and vertically. On the nanometer-scale, the description is more difficult due to convolution distortion - vertical dimensions are measured more precisely, lateral sizes and morphology are deformed.
In other modes, the AFM can map regions of different material properties (friction coefficient, Young modulus, etc.). Also, the point spectroscopy can be performed. Applications: particle size distribution, study of surfaces, nanostructures, cell structure and biomolecules, particle size and morphology, surface roughness |
Specification |
|
Manual | In the lab |
Extern | No |
Přesun | No |
Loan conditions | By Agreement |